|
age_time
|
[...]
|
The duration in the future at which the transistor degradation and degraded SPICE model parameters are to be calculated.
|
|
deltad
|
[...]
|
Specifies the degradation value.
|
|
deltad_mod
|
[...]
|
Specifies the name of a model whose lifetime is calculated. The model name must be the same as specified in the .model card.
|
|
deg_ratio_type
|
include
|
Includes or excludes the specified devices or the device during TMI Aging Simulation flow. Possible values are include and exclude.
|
|
deg_ratio_dev
|
[...]
|
Specifies the instances to be included or excluded for degradation ratio for TMI Aging flow.
|
|
report_model_param
|
no
|
Determines whether to print the stress and aged parameters in the.bm# file. Possible values are no and yes.
|
|
accuracy
|
1
|
Specifies methods used in the reliability simulation when performing integration and substrate current calculation. Possible values are 1 and 2.
|
|
minage
|
0.0
|
Specifies the smallest Age value for which degraded SPICE model parameters are calculated.
|
|
igatemethod
|
calc
|
Specifies the method used for obtaining the gate currents of MOSFETs. Possible values are calc and spice.
|
|
idmethod
|
ids
|
Specifies how the simulator obtains the drain current (Id) of MOSFETs to perform reliability calculations. Possible values are ids, idrain and idstatic.
|
|
dumpagemodel
|
|
Output file name of dump age model.
|
|
dumpagemodel_dev
|
[...]
|
Specifies the instances whose aged modelcard will be output.
|
|
urilib_file
|
|
Specifies URI library file name.
|
|
urilib_mode
|
agemos
|
Specifies which method should be used to perform aging simulation. Note: appendage mode is not supported in the MMSIM10.1.0 release. Possible values are agemos, scaleparam, mixed_mode, appendage, new_appendage, appendage2 and appendage1.
|
|
urilib_debug
|
0
|
Specifies the debug mode for URI library. The value can be 0 or 1. When specified, a flag is added to the URI library indicating whether the debug information should be printed. debugMode=1 prints debug messages. Default value is 0.
|
|
relxtran_start
|
0.0
|
Specifies the start time of reliability analysis during transient simulation.
|
|
relxtran_stop
|
0.0
|
Specifies the stop time of reliability analysis during transient simulation. If stop_time is not specified, the software stops in .tran statement.
|
|
isubmethod
|
calc
|
Specifies the method used for obtaining the substrate currents of MOSFET. Possible values are calc and spice.
|
|
opmethod
|
calc
|
Specifies whether the Igate or Isub value should be obtained from the SPICE models (for example, BSIM3 or BSIM4) or whether the internal Igate or Isub equation should be used. Possible values are calc and spice.
|
|
degsort_threshold
|
0.0
|
Prints MOS transistors based on the threshold and number settings. The results are sorted in the descending order of degradation.
|
|
degsort_num
|
0
|
Prints only the first <number> transistors having the highest degradations. For example, if number=100, the software will print the first 100 transistors with highest degradations.
|
|
combine_deg
|
no
|
Determines whether to combine the external URI results with internal URI results in bo0 file. Possible values are no and yes.
|
|
keep_aged_data
|
yes
|
Determines whether to keep the value of the aged model parameters after reliability analysis. Possible values are no and yes.
|
|
check_neg_aging_type
|
error
|
Specifies the message type to check the negative value in bt0. Default is error. Possible values are error, warn and ignore.
|
|
check_neg_aging_clamp
|
no
|
Clamps the negative age value in the bt0 file. Possible values are no and yes.
|
|
tranflag
|
0
|
Specify the reliability transient analysis flag..
|
|
stress_tran_name
|
[...]
|
Specifies stress transient analysis name.
|
|
aging_tran_name
|
[...]
|
Specifies aging transient analysis name.
|
|
enablenativeage
|
no
|
Enable the negative age value. Possible values are no and yes.
|
|
output_binary_file
|
no
|
Specifies reliability analysis output file format. Possible values are no and yes.
|
|
deg_ratio_hci
|
1.0
|
The degradation ratio for HCI effect.
|
|
deg_ratio_nbti
|
1.0
|
The degradation ratio for NBTI effect.
|
|
deg_ratio_pbti
|
1.0
|
The degradation ratio for PBTI effect.
|
|
deg_ratio_bti
|
1.0
|
The degradation ratio for NBTI/PBTI effect.
|
|
resetanalysisparam
|
tran
|
Reset the analysis parametersin the reliability block. Possible values are tran, dc and ac.
|
|
urilib_type
|
inline
|
Compatible with RelXpert. Possible values are inline, sub and dev.
|
|
enable_ade_process
|
no
|
running reliability in ADE. Possible values are no and yes.
|
|
output_region_param
|
no
|
Prints the region method of the parameter. Possible values are no and yes.
|
|
deg_ratio_hcin
|
1.0
|
The degradation ratio for NMOS HCI effect.
|
|
deg_ratio_hcip
|
1.0
|
The degradation ratio for PMOS HCI effect.
|
|
deg_ratio_btin
|
1.0
|
The degradation ratio for PBTI effect.
|
|
deg_ratio_btip
|
1.0
|
The degradation ratio for NBTI effect.
|
|
deltad_item
|
|
Specify the electrical parameter for lifetime estimation. It is only available for TMI aging flow. Possible values are didsat, didlin, dvtlin, dvtsat and lifetime.
|
|
degsort_item
|
0
|
Specify which item is used for sorting It is only available for TMI aging flow. Possible values are didsat, didlin, dvtlin, dvtsat and lifetime.
|
|
simmode
|
|
Mode of reliability analysis. Possible values are stress, aging and all.
|
|
simmode_file
|
|
File of simMode.
|
|
simmode_tmifile
|
|
Input file for TMI Aging flow.
|
|
tmi_aging_mode
|
|
Mode of tmi aging flow. Possible values are aging, she and all.
|
|
degsort
|
no
|
Specifies to enable to sort degradation data in decreasing order. Possible values are no and yes.
|
