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Virtuoso® UltraSim Simulator User Guide
Product Version 18.1 January 2019


13 

Flash Core Cell Models

This chapter describes the flash core cell macro models supported by the Virtuoso® UltraSim simulator. The simulator is able to model the floating gate effect of the flash core cell, in addition to conventional MOSFET models, such as MOS level 1 and BSIM3.

The flash core cell model is more accurate and flexible than conventional models using analog hardware description language (HDL) or complicated subcircuits comprised of many elements. The model also allows simultaneous simulation of the flash core cell with peripheral circuitry. Based on parameterized equations, the effects of the floating gate charge are tracked by the change of threshold voltage (Vth) of the cell. The flash core cell can model different events, such as programming, erasing, and reading during the simulation. Since each type of event is controlled by different physics, the Vth equations are different for each event.

Device

mcell nd ng ns npw [ndnw] model_name [l=length] [w=width] [deltvthinit=val] [delvto=val]

Description

The flash core cell is a MOSFET device with a floating gate. The Virtuoso UltraSim simulator supports single n-well and embedded p-well processes. A single n-well process results in a four pin device and an embedded p-well process results in a five pin device. The device parameters are listed in Table 13-1.

 

Table 13-1  Device Parameters 

Parameter

Description

mcell

MOSFET transistor for flash core cell

nd

Drain node

ng

Gate node

ns

Source node

npw

P-well node for n-MOSFET device

ndnw

Deep N-well node (optional)

model_name

Model name

l

Device length

w

Device width

deltvthinit or delvto

Device Vth shift at time 0 (default is 0 V)

Models

.model model_name flashcell flashlevel=val <parameter1=val1> <parameter2=val2>

Note: The flashcell keyword is used to indicate that the model card is a flash core cell model card. In addition, the flashlevel parameter can be set to 1, 2, or 3 according to the flash cell type being simulated (model parameters for different flash cell types are listed in Tables 13-2, 13-3, and 13-4).

Description

The Virtuoso UltraSim simulator supports flash core cell models based on MOS level 1 or BSIM3v3 models. The Vth of the transistor varies according to parameterized equations. The flash core cell model consists of two parts: The flash core cell model parameters used to model Vth changes and the conventional MOSFET model.

 

Table 13-2  Model Parameters for flashlevel=1 (NOR Type) 

Parameter

Description

Default Value

tpgmstep

Timestep at which Vth is adjusted for programming event during simulation

10 ns

tersstep

Timestep at which Vth is adjusted for erasing event

500 ns

kpgm

Change in Vth during programming event (per tpgmstep)

2e-3 V

kers

Change in Vth during erasing event (per tersstep)

0.15e-3 V

vgpgmmin

Minimum of Vgate during programming event

1 V

vdpgmmin

Minimum of Vdrain during programming event

1 V

vspgmmax

Maximum of Vsource during programming event

1 mV

vpwpgmmax

Maximum of Vpwell during programming event

0 V

vgersmax

Maximum of Vg during erasing event

0 V

vpwersmin

Minimum of Vpwell during erasing event

0 V

vdersmin

Minimum of Vdrain during erasing event

Note: The vdersmin parameter is a required flash core cell model card parameter.

No default

vsersmin

Minimum of Vsource during erasing event

0 V

flashvcc

Flash core cell voltage supply

20 V

vthigh

Maximum of Vth

10 V

vtlow

Minimum of Vth

-10 V

vtpgmmaxshift

Absolute maximum Vth shift in a single programming event

10 V

vtersmaxshift

Absolute maximum Vth shift in a single erasing event

10 V

 

Table 13-3  Model Parameters for flashlevel=2 (NOR Type) 

Parameter

Description

Default Value

kpgm

Change in Vth during programming event (per tpgmstep)

2e-3 V

kers

Change in Vth during erasing event (per tersstep)

0.1e-3 V

tpgmstep

Time interval for Vth update during programming event

10 ns

tersstep

Time interval for Vth update during erasing event

500 ns

vgpgmmin

Minimum gate voltage to start programming event

1 V

vgpgmmax

Maximum gate voltage to start programming event

10 V

vdpgmmin

Minimum drain voltage to start programming event

1 V

vdpgmmax

Maximum drain voltage to start programming event

10 V

vpwpgmmin

Minimum pwell voltage to start programming event

-4 V

vpwpgmmax

Maximum pwell voltage to start programming event

0 V

vnwpgmmin

Minimum nwell voltage to start programming event

0 V

vnwpgmmax

Maximum nwell voltage to start programming event

20 V

vgersmin

Minimum gate voltage to start erasing event

-15 V

vgersmax

Maximum gate voltage to start erasing event

0 V

vdersmin

Minimum drain voltage to start erasing event

0 V

vsersmin

Minimum source voltage to start erasing event

0 V

vsersmax

Maximum source voltage to start erasing event

1 V

Vpwersmin

Minimum pwell voltage to start erasing event

0 V

vnwersmin

Minimum nwell voltage to start erasing event

3.5 V

vtpgmmaxshift

Maximum Vth shift during programming event

10 V

vtersmaxshift

Maximum Vth shift during erasing event

10 V

vthigh

Maximum value of Vth after programming event

10 V

vtlow

Maximum value of Vth after erasing event

-10 V

 

Table 13-4  Model Parameters for flashlevel=3 (NAND Type) 

Parameter

Description

Default Value

kpgm

Change in Vth during simulation programming event (per tpgmstep)

1V/1 us

kers

Change in Vth during erasing event (per tersstep)

1V/1 us

tpgmstep

Time interval for Vth update during programming event

10 ns

tersstep

Time interval for Vth update during erasing event

10 ns

vgspgmmin

Minimum gate to source voltage to start programming event

10 V

vgspgmmax

Maximum gate to source voltage for programming event

30 V

vsbpgmmax

Maximum source-to-body voltage to start program

0.5 V

vpwgersmin

Minimum pwell to gate voltage to start erasing event

10 V

vpwgersmax

Maximum pwell to gate voltage for erasing event

30 V

delvto

Initial value for cell Vth

0 V

vthigh

Maximum value of Vth after programming event

5 V

vtlow

Maximum value of Vth after erasing event

-5 V

Examples

The flash core cell model must be attached to the conventional MOSFET model in order to function. To attach a flash core cell model to a MOSFET model, use the following command:

.appendmodel flash=dest_mod_name model=src_mod_name

dest_mod_name is the name of the flash core cell model and src_mod_name is the name of the conventional MOSFET model.

For example

.model fnmos1 flashcell flashlevel=1 vthigh=10

tells the simulator that fnmos1 is a flash core cell model and that flashlevel and vthigh are its model parameters.

The next example

.model tn nmos level=49 vtho=0.0 k1=0.4 k2=0.3

.model nandcell flashcell flashlevel=3 vthigh=10 kpgm=2m vgspgmmin=10

.appendmodel flash=nandcell model=tn

mcell d g s pw tn l=0.9 w=1 delvto=-0.7

tells the Virtuoso UltraSim simulator that nandcell is a flash core cell model and tn is a conventional MOSFET model on which the flash core cell model is attached.


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