View-in-Concert Mode

View-in-concert mode allows designers with limited permissions to view package and IC representations alongside each other, similar to edit-in-concert mode. This functionality is used by designers to analyze their focus sections of an IC in the context of the package and view the package routing near it. The other items in the Module menu are enabled or disabled based on the read or write permissions of a cellview. The View-In-Concert menu item is visible only when the cellview is opened in read-only mode.

You can trace and probe nets across fabrics in view-in-concert mode. The probing of bump and ball is also enabled.

The following edit-in-concert features are partially available in view-in-concert mode.

• For read-only cellviews, you can view dies in the Virtuoso 3D viewer but are not able to configure die stacks because changes to die parameters are not allowed. All editable fields in the Configure Module Stack form are disabled.
• You can view violations or markers though the Layout vs Abstract (LVS) checker and fixer. You are also able to run the checker on read-only package cellviews but you cannot save or fix markers in the Annotation Browser.
• You can run cross-fabric checks on board, module, or package cellview. It generates the complete report, markers are created, and the Cross Fabric Check Violation Summary and Navigation form is launched, but you cannot save or fix the markers.
• You can view-in-concert shape-based abstract cellviews but cannot perform LVA check or trace nets.

The following edit-in-concert features are not available in view-in-concert mode.

• Any movement in the IO pad position in a die layout is not replicated on the die footprint in package cellview.
• Bind Layout binds a die layout with a die instance by adding properties on die instance or abstract cellview. Therefore, it requires a package to be editable.
• Bump management commands are not supported.

Related Topics

Edit-in-Concert