report_yield
report_yield [ -ylds_fileName] [ -reports_fileName] [ -gridXi_micron] [ -gridYi_micron] [ -detail [ true | false ] ]
Description
Reports the expected yield for the design using critical area analysis, based on the technology you are using and the probability of failure of the cells, vias, and point defects in routing. Uses data from a yield technology file supplied by the fabricator. Generates a yield report and a yield map.
To display the generated yield map graphically, use display_color_map with one of the following -name arguments: YldCell, YldVia, YldShort, YldOpen, YldRouting.
Arguments
Examples
The following example creates a detailed yield report named yield.rpt.
report_yield -detail -report yield.rpt
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