7

---

High Yield Estimation

---

Parametric high yield estimation is required on devices that have extremely high volume, that is memory devices, or when testing the circuit limits is a must when failure of the part is not an option, for example, automotive safety or medical devices.

The Virtuoso Variation Option provides two methods of simulation to meet and match your needs and conditions:

• Scaled-Sigma Sampling (SSS)
  This method generates samples where the standard deviation has been scaled up.
• Worst-Case Distance (WCD)
  This method defines the shortest distance from the nominal point to the specification boundary in the process/mismatch parameter space.

Related Topics

The Scaled-Sigma Sampling Method

The Worst-Case Distance Method