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level=1002
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Model level must be 1002.
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version=1
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Model version.
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subversion=0
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Model subversion.
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revision=0
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Model revision.
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type=n
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Type parameter, n reflects n-type, p reflects p-type. Possible values are n and p.
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dta=0 C
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Temperature offset with respect to ambient temperature.
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imax=1000 A
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Maximum current up to which forward current behaves exponentially.
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trj=21 C
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Reference temperature.
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cjorbot=1E-3 Fm-2
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Zero-bias capacitance per unit-of-area of bottom component.
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cjorsti=1E-9 Fm^-1
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Zero-bias capacitance per unit-of-length of STI-edge component.
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cjorgat=1E-9 Fm^-1
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Zero-bias capacitance per unit-of-length of gate-edge component.
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vbirbot=1 V
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Built-in voltage at the reference temperature of bottom component.
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vbirsti=1 V
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Built-in voltage at the reference temperature of STI-edge component.
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vbirgat=1 V
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Built-in voltage at the reference temperature of gate-edge component.
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pbot=0.5
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Grading coefficient of bottom component.
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psti=0.5
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Grading coefficient of STI-edge component.
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pgat=0.5
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Grading coefficient of gate-edge component.
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phigbot=1.16 V
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Zero-temperature bandgap voltage of bottom component.
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phigsti=1.16 V
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Zero-temperature bandgap voltage of STI-edge component.
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phiggat=1.16 V
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Zero-temperature bandgap voltage of gate-edge component.
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idsatrbot=1E-12 Am-2
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Saturation current density at the reference temperature of bottom component.
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idsatrsti=1E-18 Am^-1
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Saturation current density at the reference temperature of STI-edge component.
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idsatrgat=1E-18 Am^-1
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Saturation current density at the reference temperature of gate-edge component.
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csrhbot=1E2 Am-3
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Shockley-Read-Hall prefactor of bottom component.
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csrhsti=1E-4 Am-2
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Shockley-Read-Hall prefactor of STI-edge component.
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csrhgat=1E-4 Am-2
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Shockley-Read-Hall prefactor of gate-edge component.
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xjunsti=100E-9 m
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Junction depth of STI-edge component.
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xjungat=100E-9 m
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Junction depth of gate-edge component.
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ctatbot=1E2 Am-3
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Trap-assisted tunneling prefactor of bottom component.
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ctatsti=1E-4 Am-2
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Trap-assisted tunneling prefactor of STI-edge component.
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ctatgat=1E-4 Am-2
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Trap-assisted tunneling prefactor of gate-edge component.
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mefftatbot=0.25
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Effective mass (in units of m0) for trap-assisted tunneling of bottom component.
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mefftatsti=0.25
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Effective mass (in units of m0) for trap-assisted tunneling of STI-edge component.
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mefftatgat=0.25
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Effective mass (in units of m0) for trap-assisted tunneling of gate-edge component.
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cbbtbot=1E-12 AV-3
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Band-to-band tunneling prefactor of bottom component.
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cbbtsti=1E-18 AV-3m
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Band-to-band tunneling prefactor of STI-edge component.
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cbbtgat=1E-18 AV-3m
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Band-to-band tunneling prefactor of gate-edge component.
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fbbtrbot=1E9 Vm^-1
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Normalization field at the reference temperature for band-to-band tunneling of bottom component.
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fbbtrsti=1E9 Vm^-1
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Normalization field at the reference temperature for band-to-band tunneling of STI-edge component.
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fbbtrgat=1E9 Vm^-1
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Normalization field at the reference temperature for band-to-band tunneling of gate-edge component.
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stfbbtbot=(-1E-3) K^-1
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Temperature scaling parameter for band-to-band tunneling of bottom component.
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stfbbtsti=(-1E-3) K^-1
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Temperature scaling parameter for band-to-band tunneling of STI-edge component.
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stfbbtgat=(-1E-3) K^-1
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Temperature scaling parameter for band-to-band tunneling of gate-edge component.
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vbrbot=10 V
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Breakdown voltage of bottom component.
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vbrsti=10 V
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Breakdown voltage of STI-edge component.
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vbrgat=10 V
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Breakdown voltage of gate-edge component.
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pbrbot=4 V
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Breakdown onset tuning parameter of bottom component.
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pbrsti=4 V
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Breakdown onset tuning parameter of STI-edge component.
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pbrgat=4 V
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Breakdown onset tuning parameter of gate-edge component.
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rsbot=0.0 VA^-1m2
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Series resistance per unit-of-area of bottom component.
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rssti=0.0 VA^-1m
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Series resistance per unit-of-length of STI-edge component.
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rsgat=0.0 VA^-1m
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Series resistance per unit-of-length of gate-edge component.
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rscom=0.0 ohm
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Common series resistance, no scaling.
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strs=0
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Temperature scaling parameter for series resistance.
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kf=0
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KF parameter for flicker noise.
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af=1.0
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AF parameter for flicker noise.
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tt=0 s
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Transit time.
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stvbrbot1=0 1/K
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Temp. co of breakdown voltage bottom component.
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stvbrbot2=0 1/K2
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Temp. co of breakdown voltage bottom component.
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stvbrsti1=0 1/K
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Temp. co of breakdown voltage STI-edge component.
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stvbrsti2=0 1/K2
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Temp. co of breakdown voltage STI-edge component.
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stvbrgat1=0 1/K
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Temp. co of breakdown voltage gate-edge component.
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stvbrgat2=0 1/K2
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Temp. co of breakdown voltage gate-edge component.
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nfabot=1.0
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ideality factor bottom component.
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nfasti=1.0
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ideality factor STI-edge component.
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nfagat=1.0
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ideality factor gate-edge component.
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abmin=0.0 m2
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minimum allowed junction area.
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abmax=1.0 m2
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maximum allowed junction area.
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lsmin=0.0 m
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minimum allowed junction STI-edge.
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lsmax=1.0 m
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maximum allowed junction STI-edge.
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lgmin=0.0 m
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minimum allowed junction gate-edge.
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lgmax=1.0 m
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maximum allowed junction gate-edge.
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tempmin=(-55) C
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minimum allowed junction temp.
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tempmax=155 C
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maximum allowed junction temp.
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vfmax=0.0 V
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maximum allowed forward junction bias.
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vrmax=0.0 V
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maximum allowed reverse junction bias.
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pt=3
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Temp. co of saturation current.
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xti=3
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Temp. co of saturation current.
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scalee=1.0
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Scale parameter.
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shrink=0
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Scale parameter.
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swjunexp=0.0
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Flag for JUNCAP-express; 0=full model, 1=express model.
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vjunref=2.5
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Typical maximum junction voltage; usually about 2*VSUP.
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fjunq=0.03
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Fraction below which junction capacitance components are considered negligible.
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corecovery
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Flag for recovery equations; 0=original and 1=hiroshima
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njh=1.0
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High-injection emission coefficient.
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njdv=0.1 1/V
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Transition slope of emission coefficient
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ndibot=1e16 cm-3
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Doping concentration of drift region.
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ndigat=1e16 cm-3
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Doping concentration of drift region.
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ndisti=1e16 cm-3
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Doping concentration of drift region.
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inj1=1.0
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For carrier density.
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inj2=10.0
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For carrier density in high-density injection.
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nqs=5e-9 sec
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Carrier delay time.
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tau=2e-7 sec
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Carrier lifetime.
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wi=5e-6 m
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Length of drift region.
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depnqs=0.0 sec
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Depletion delay time.
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tnom=21 C
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Alias reference temperature.
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taut=0.0
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Temperature coefficient of carrier lifetime.
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injt=0.0
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Temperature coefficient of carrier density in high injection condition.
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