Product Documentation
Spectre Circuit Simulator Components and Device Models Reference
Product Version 23.1, June 2023

Component Statements

Model Definition

model modelName utsoi2 parameter=value ...

Instance Definition

Name  d  g  s  b  [Tnode] ModelName parameter=value ...

Instance Parameters

1

l=1.0e-6

Channel length(m).

2

w=1.0e-6

Channel width(m).

3

asource=1.0e-12

Source region area (m^2).

4

adrain=1.0e-12

Drain region area (m^2).

5

psource=1.0e-6

Source region perimeter (m).

6

pdrain=1.0e-6

Drain region perimeter (m).

7

sa=0.0

Distance between OD-edge and poly at source side(m).

8

sb=0.0

Distance between OD-edge and poly at drain side(m).

9

sd=0.0

Distance between neighboring fingers(m).

10

nf=1.0

Number of fingers.

11

mult=1.0

Number of devices in parallel.

12

m=1.0

Number of devices in parallel.

13

delvto=0.0

Threshold voltage shift parameter (V).

14

factuo=1.0

Low-field mobility pre-factor.

15

trise=0.0

Temperature rise from ambient.

16

isnoisy=yes

Should device generate noise. Possible values are yes and no.

17

dtemp

Alias for trise.

Model Parameters

1

swscale=0.0

Parameter setting mode (local=0, global=1).

2

version=2.00

Model version number. Available versions are 2.00, 2.10, 2.11, 2.20, and 2.30. The default version is 2.00.

3

swclipchk=0.0

Flag for checking of parameters clipping (without=0, with=1).

4

swsubdep=0.0

Flag for substrate depletion model (without=0, with=1).

5

swigate=0.0

Flag for gate current (without=0, with=1).

6

swgidl=0.0

Flag for GIDL current (without=0, with=1).

7

swshe=0.0

Flag for self-heating effect (without=0, with=1).

8

swign=1.0

Flag for induced gate noise model (without=0, with=1).

9

swjunasym=0.0

Flag for source/drain junction asymmetry (without=0, with=1).

10

qmc=1.0

Quantum correction factor (no correction=0, full correction=1).

11

type=1.0

Channel type parameter, +1|n=NMOS -1|p=PMOS. Possible values are p and n.

12

tr=21.0 C

Nominal temperature.

12

tref=21.0

alias of TR, Nominal temperature (C).

13

tmax=150.0

Maximum self-heating temperature elevation (C).

14

toxe=2.0e-09

Front gate equivalent oxide thickness (m).

15

tsi=1.0e-08

Silicon or SiGe film thickness (m).

16

xge=0.0

Fraction of Ge content in the channel.

17

tbox=1.0e-07

Back gate oxide thickness (m).

18

nch=0.0

Thin film doping (n-type=negative value, p-type=positive value) (cm^-3).

19

nsub=3.0e18

Substrate doping (n-type=negative value, p-type=positive value) (cm^-3).

20

ct=0.0

Interface states factor.

21

toxp=2.0e-09

Front gate physical oxide thickness (m).

22

nov=1.0e20

Effective doping of overlap-ldd regions (no doping effect=0) (cm^-3).

23

novd=1.0e20

Effective doping of overlap-ldd regions ar drain side (cm^-3).

24

vfb=0.0

Flat-band voltage of the front gate at TR (V).

25

vfbb=0.0

Flat-band voltage of the back gate at TR (V).

26

stvfb=0.0

Temperature dependence of VFB and VFBB (V/K).

27

cicf=1.0

Long channel front interface coupling coefficient.

28

cic=1.0

Long channel back interface coupling coefficient.

29

psce=0.0

Short channel effect coefficient.

30

psceb=1.0

Short channel back to front interface asymmetry factor.

31

pscedl=0.0

Short channel modulation coefficient due to Leff variation.

32

nsddc=1.0e22

Source/Drain effective doping level for DC model (cm^-3).

33

pscedlb=0.0

Back bias dependence of short channel effect modulation.

34

pnce=0.0

Narrow channel effect on body factor.

35

cf=0.0

DIBL parameter.

36

cfb=1.0

DIBL back-to-front interface asymmetry factor.

37

stcf=0.0

Temperature dependence of CF, with same scaling as CF.

38

cfd=0.2

Drain voltage dependence parameter of DIBL (V).

39

cfdl=0.0

DIBL modulation coefficient due to Leff variation.

40

cfdlb=0.0

Back bias dependence of DIBL modulation.

41

betn=5.0e-2

Front channel aspect ratio times zero-field mobility (m^2/V/s).

42

betnb=1.0

Back channel over front channel zero-field mobility ratio.

43

stbet=1.5

Temperature dependence of BETN.

44

cs=0.0

Remote Coulomb scattering parameter at TR.

45

csfi=0.0

Field dependence of Coulomb scattering at front interface.

46

csbi=0.0

Field dependence of Coulomb scattering at back interface.

47

stcs=0.0

Temperature dependence of CS.

48

thecs=1.5

Remote Coulomb scattering exponent at TR.

49

stthecs=0.0

Temperature dependence of THECS.

50

csthr=2.0

Remote Coulomb scattering threshold level.

51

csthrb=1.0

Remote Coulomb scattering threshold asymmetry parameter.

52

mue=0.0

Front channel mobility reduction coefficient at TR (cm/MV).

53

stmue=0.0

Temperature dependence of MUE.

54

themu=1.5

Front channel mobility reduction exponent at TR.

55

stthemu=0.0

Temperature dependence of THEMU.

56

xcor=0.0

Front channel non-universality factor (V^-1).

57

xcorb=1.0

Asymmetry term of non-universality factor.

58

stxcor=0.0

Temperature dependence of XCOR.

59

feta=1.0

Effective field parameter.

60

rs=30.0

Source/Drain series resistance at TR (Ohm).

61

rsig=0.0

Source/Drain extension resistance coefficient.

62

strs=0.0

Temperature dependence of RS.

63

rsg=0.0

Transverse electric field dependence of RS.

64

thersg=2.0

Transverse electric field dependence exponent of RS.

65

rsb=0.0

Back bias dependence of RS.

66

thesat=0.0

Velocity saturation parameter at TR (V^-1).

67

stthesat=(-0.1)

Temperature dependence of THESAT.

68

thesatg=0.0

Front gate bias dependence of velocity saturation.

69

thesatb=0.0

Back gate bias dependence of velocity saturation.

70

ax=8.0

Linear/saturation transition exponent.

71

alp=0.0

CLM pre-factor.

72

alp1=0.0

CLM enhancement factor above threshold (V).

73

alpb=0.0

Back bias dependence of channel length modulation.

74

vp=0.05

CLM logarithm dependence factor (V).

75

vpg=0.0

Transverse electric field dependence of CLM logarithm factor.

76

gco=0.0

Gate tunneling energy adjustment in inversion.

77

iginv=0.0

Gate-to-channel current pre-factor (A).

78

igovinv=0.0

Gate-to-overlap current pre-factor in inversion (A).

79

igovinvd=0.0

Gate-to-overlap current pre-factor in inversion at drain side (A).

80

igovacc=0.0

Gate-to-overlap current pre-factor in accumulation (A).

81

igovaccd=0.0

Gate-to-overlap current pre-factor in accumulation at drain side (A).

82

stig=0.0

Temperature dependence of all gate currents.

83

gc2ch=0.375

Gate-to-channel current slope factor.

84

gc3ch=0.063

Gate-to-channel current curvature factor.

85

gc2ov=0.375

Gate current slope factor in overlaps.

86

gc3ov=0.063

Gate current curvature factor in overlaps.

87

gc2ovinv=0.375

Gate current slope factor for overlap regions in inversion mode.

88

gc3ovinv=0.063

Gate current curvature factor for overlap regions in inversion mode.

89

gc2ovacc=0.375

Gate current slope factor for overlap regions in accumulation mode.

90

gc3ovacc=0.063

Gate current curvature factor for overlap regions in accumulation mode.

91

gcdov=0.0

High drain voltage dependence of overlap gate current (V^-1).

92

gcvdov=1.0

Threshold of high drain voltage effect on overlap gate current (V).

93

chib=3.1

Tunneling barrier height (V).

94

niginv=0.0

Gate tunneling slope adjustment in subthreshold regime.

95

agidl=0.0

GIDL pre-factor (A/V^3).

96

agidld=0.0

GIDL pre-factor at drain side (A/V^3).

97

bgidl=41.0

GIDL probability factor at TR (V).

98

bgidld=41.0

GIDL probability factor at TR at drain side (V).

99

stbgidl=0.0

Temperature dependence of BGIDL (V/K).

100

stbgidld=0.0

Temperature dependence of BGIDL at drain side (V/K).

101

cgidl=0.0

Substrate bias dependence of GIDL (V^-1).

102

cgidld=0.0

Substrate bias dependence of GIDL at drain side (V^-1).

103

dgidl=0.0

High longitudinal field parameter of GIDL (V^-1).

104

dgidld=0.0

High longitudinal field parameter of GIDL at drain side (V^-1).

105

areaq=1.0e-12

Effective channel area for intrinsic CV (m^2).

106

cgbov=0.0

Oxide capacitance for gate-substrate overlap (F).

107

nsdac=1.0e22

Source/Drain effective doping level for AC model (cm^-3).

108

fif=0.0

Inner fringe capacitance prefactor.

109

fsceac=0.0

Short channel effect adjustment factor for charge model.

110

cov=0.0

Overlap capacitance per side (F).

111

covd=0.0

Overlap capacitance at drain side (F).

112

covdl=0.0

Overlap capacitance modulation coefficient due to Leff variation.

113

covdlb=0.0

Overlap capacitance modulation with back bias.

114

dvfbov=0.0

Overlap capacitance flat-band voltage adjustment (V).

115

cfr=0.0

Outer fringe capacitance per side (F).

116

cfrd=0.0

Outer fringe capacitance at drain side (F).

117

csd=0.0

Drain-source capacitance (F).

118

csdbp=0.0

Drain/source to substrate perimeter capacitance (F/m).

119

rth=1.0e4

Thermal resistance (K/W).

120

strth=0.0

Temperature dependence of RTH.

121

cth=1.0e-11

Thermal capacitance (J/K).

122

fnt=1.0

Thermal noise coefficient.

123

nfa=8.0e+22

First coefficient of flicker noise (V^-1/m^4).

124

nfb=3.0e+07

Second coefficient of flicker noise (V^-1/m^2).

125

nfc=0.0

Third coefficient of flicker noise (V^-1).

126

nfe=0.0

Flicker noise front transverse field effect coefficient.

127

nfeb=0.0

Flicker noise back transverse field effect coefficient.

128

ef=1.0

Frequency coefficient of flicker noise.

129

lvaro=0.0

Geometry-independent difference between physical and drawn gate lengths (m).

130

lvarl=0.0

Length dependence of LPS.

131

lvarw=0.0

Width dependence of LPS.

132

lap=0.0

Effective channel length reduction per side (m).

133

wvaro=0.0

Geometry-independent difference between physical and drawn field-oxide opening (m).

134

wvarl=0.0

Length dependence of WOD.

135

wvarw=0.0

Width dependence of WOD.

136

wot=0.0

Effective reduction of channel width per side (m).

137

dlq=0.0

Effective channel length additional offset for charge model (m).

138

dwq=0.0

Effective channel width additional offset for charge model (m).

139

toxeo=2.0e-9

Front gate equivalent oxide thickness (m).

140

tsio=1.0e-8

Silicon or SiGe film thickness (m).

141

xgeo=0.0

Fraction of Ge content in the channel.

142

tboxo=1.0e-7

Buried oxide thickness (m).

143

ncho=0.0

Thin film doping (n-type=negative value, p-type=positive value) (cm^-3).

144

nsubo=3.0e18

Substrate doping (n-type=negative value, p-type=positive value) (cm^-3).

145

cto=0.0

Interface states factor.

146

toxpo=2.0e-09

Front gate physical oxide thickness (m).

147

novo=1.0e20

Effective doping of overlap-ldd regions (no doping effect=0) (cm^-3).

148

novdo=1.0e20

Effective doping of overlap-ldd regions at drain side (cm^-3).

149

vfbo=0.0

Geometry-independent front gate flat-band voltage at TR (V).

150

vfbl=0.0

Length dependence of VFB (V).

151

vfblexp=2.0

Exponent describing length dependence of VFB.

152

vfbl2=0.0

Second order length dependence of VFB.

153

vfblexp2=2.0

Exponent of second order length dependence of VFB.

154

vfbw=0.0

Width dependence of VFB (V).

155

vfblw=0.0

Area dependence of VFB.

156

vfbbo=0.0

Geometry-independent back gate flat-band voltage at TR (V).

157

vfblbo=1.0

Roll-off back to front interface asymmetry factor.

158

stvfbo=0.0

Geometry-independent temperature dependence of VFB and VFBB (V/K).

159

stvfbl=0.0

Length dependence of STVFB.

160

stvfbw=0.0

Width dependence of STVFB.

161

stvfblw=0.0

Area dependence of STVFB.

162

cicfo=1.0

Long channel front interface coupling coefficient.

163

cico=1.0

Long channel back interface coupling coefficient.

164

pscel=0.0

Length dependence of PSCE.

165

pscelexp=2.0

Exponent describing length dependence of PSCE.

166

pscew=0.0

Width dependence of PSCE.

167

pscebo=1.0

Short channel back to front interface asymmetry factor.

168

pscedll=0.0

Short channel modulation coefficient due to Leff variation.

169

pscedlw=0.0

Width dependence of PSCEDL.

170

nsddco=1.0e22

Source/Drain effective doping level for DC model (cm^-3).

171

pscedlbo=0.0

Back bias dependence of short channel effect modulation.

172

pncew=0.0

Narrow channel effect on body factor for a width of WEN.

173

cfl=0.0

Length dependence of DIBL parameter.

174

cflexp=2.0

Exponent for length dependence of CF.

175

cfw=0.0

Width dependence of CF.

176

cfbo=1.0

DIBL back-to-front interface asymmetry factor.

177

stcfo=0.0

Temperature dependence of CF.

178

stcfl=0.0

Temperature dependence of CF, with same scaling as CF.

179

cfdo=0.2

Drain voltage dependence parameter of DIBL (V).

180

cfdll=0.0

DIBL modulation coefficient due to Leff variation.

181

cfdlw=0.0

Width dependence of CFDL.

182

cfdlbo=0.0

Back bias dependence of DIBL modulation.

183

uo=5.0e-2

Front channel zero-field mobility at TR (m^2/V/s).

184

fbet1=0.0

First length dependence modulation of BETN.

185

fbet1w=0.0

Width dependence of FBET1.

186

lp1=1.0e-8

First characteristic length of BETN scaling (m).

187

lp1w=0.0

Width dependence of LP1.

188

fbet2=0.0

Second length dependence modulation of BETN.

189

lp2=1.0e-8

Second characteristic length of BETN scaling (m).

190

betw1=0.0

First width dependence modulation of BETN.

191

betw2=0.0

Second width dependence modulation of BETN.

192

wbet=1.0e-8

Characteristic width of BETN scaling (m).

193

betnl=0.0

Second order length dependence of BETN.

194

betnlexp=1.0

Exponent for the second order length dependence of BETN.

195

betnw=0.0

Second order width dependence of BETN.

196

betnbo=1.0

Back channel over front channel zero-field mobility ratio.

197

stbeto=1.5

Geometry-independent temperature dependence of BETN.

198

stbetl=0.0

Length dependence of STBET.

199

stbetw=0.0

Width dependence of STBET.

200

stbetlw=0.0

Area dependence of STBET.

201

cso=0.0

Remote Coulomb scattering parameter at TR.

202

csl=0.0

Length dependence of CS.

203

cslexp=1.0

Exponent describing length dependence of CS.

204

csw=0.0

Width dependence of CS.

205

cslw=0.0

Area dependence of CS.

206

csfio=0.0

Field dependence of Coulomb scattering at front interface.

207

csbio=0.0

Field dependence of Coulomb scattering at back interface.

208

stcso=0.0

Temperature dependence of CS.

209

stcsl=0.0

Length dependence of STCS.

210

stcsw=0.0

Width dependence of STCS.

211

stcslw=0.0

Area dependence of STCS.

212

thecso=1.5

Remote Coulomb scattering exponent at TR.

213

stthecso=0.0

Temperature dependence of THECS.

214

csthro=2.0

Remote Coulomb scattering threshold level.

215

csthrbo=1.0

Remote Coulomb scattering threshold asymmetry parameter.

216

mueo=0.0

Front channel mobility reduction coefficient at TR (cm/MV).

217

stmueo=0.0

Temperature dependence of MUE.

218

themuo=1.5

Front channel mobility reduction exponent at TR.

219

stthemuo=0.0

Temperature dependence of THEMU.

220

xcoro=0.0

Geometry-independent part of non-universality factor (V^-1).

221

xcorl=0.0

Length dependence of XCOR.

222

xcorlexp=1.0

Exponent describing length dependence of XCOR.

223

xcorw=0.0

Width dependence of XCOR.

224

xcorlw=0.0

Area dependence of XCOR.

225

xcorbo=1.0

Asymmetry term of non-universality factor.

226

stxcoro=0.0

Temperature dependence of XCOR.

227

fetao=1.0

Effective field parameter.

228

rsw1=30.0

Source/Drain series resistance for channel width WEN at TR (Ohm).

229

rsw2=0.0

Higher-order width scaling of source/drain series resistance.

230

rsigo=0.0

Source/Drain extension resistance coefficient.

231

strso=0.0

Temperature dependence of RS.

232

rsgo=0.0

Transverse electric field dependence of RS.

233

thersgo=2.0

Transverse electric field dependence exponent of RS.

234

rsbo=0.0

Back bias dependence of RS.

235

thesato=0.0

Geometry-independent velocity saturation parameter at TR (V^-1).

236

thesatl=0.0

Length dependence of THESAT (s/m^2).

237

thesatlexp=1.0

Exponent for length dependence of THESAT.

238

thesatw=0.0

Width dependence of THESAT.

239

thesatlw=0.0

Area dependence of THESAT.

240

stthesato=(-0.1)

Geometry-independent temperature dependence of THESAT.

241

stthesatl=0.0

Length dependence of STTHESAT.

242

stthesatw=0.0

Width dependence of STTHESAT.

243

stthesatlw=0.0

Area dependence of STTHESAT.

244

thesatgo=0.0

Front gate bias dependence of velocity saturation.

245

thesatbo=0.0

Back gate bias dependence of velocity saturation.

246

axo=8.0

Geometry-independent linear/saturation transition exponent.

247

axl=0.0

Length dependence of AX.

248

axlexp=1.0

Exponent for length dependence of AX.

249

alpl1=0.0

Length dependence of CLM pre-factor ALP.

250

alplexp=1.0

Exponent for length dependence of ALP.

251

alpl2=0.0

Second order length dependence of ALP.

252

alplexp2=2.0

Exponent for second order length dependence of ALP.

253

alpw=0.0

Width dependence of ALP.

254

alp1l1=0.0

Length dependence of CLM enhancement factor above threshold ALP1 (V).

255

alp1lexp=0.5

Exponent for length dependence of ALP1.

256

alp1l2=0.0

Second order length dependence of ALP1.

257

alp1lexp2=1.5

Exponent for second order length dependence of ALP1.

258

alp1w=0.0

Width dependence of ALP1.

259

alpbo=0.0

Back bias dependence of channel length modulation.

260

vpo=0.05

CLM logarithm dependence factor (V).

261

vpgo=0.0

Transverse electric field dependence of CLM logarithm factor.

262

gcoo=0.0

Gate tunneling energy adjustment in inversion.

263

iginvlw=0.0

Gate to channel current pre-factor for a channel area of WEN.LEN (A).

264

igovinvw=0.0

Gate-to-overlap current pre-factor for a width of WEN in inversion (A).

265

igovinvdw=0.0

Gate-to-overlap current pre-factor for a width of WEN in inversion at drain side (A).

266

igovaccw=0.0

Gate-to-overlap current pre-factor for a width of WEN in accumulation (A).

267

igovaccdw=0.0

Gate-to-overlap current pre-factor for a width of WEN in accumulation at drain side (A).

268

stigo=0.0

Temperature dependence of all gate currents.

269

gc2cho=0.375

Gate-to-channel current slope factor.

270

gc3cho=0.063

Gate-to-channel current curvature factor.

271

gc2ovo=0.375

Gate current slope factor in overlaps.

272

gc3ovo=0.063

Gate current curvature factor in overlaps.

273

gc2ovinvo=0.375

Gate current slope factor for overlap regions in inversion mode.

274

gc3ovinvo=0.063

Gate current curvature factor for overlap regions in inversion mode.

275

gc2ovacco=0.375

Gate current slope factor for overlap regions in accumulation mode.

276

gc3ovacco=0.063

Gate current curvature factor for overlap regions in accumulation mode.

277

gcdovl=0.0

High drain voltage dependence of overlap gate current (V^-1).

278

gcvdovo=1.0

Threshold of high drain voltage effect on overlap gate current (V).

279

chibo=3.1

Tunneling barrier height (V).

280

niginvo=0.0

Gate tunneling slope adjustment in subthreshold regime.

281

agidlw=0.0

GIDL pre-factor for a width of WEN (A/V^3).

282

agidldw=0.0

GIDL pre-factor for a width of WEN at drain side (A/V^3).

283

bgidlo=41.0

GIDL probability factor at TR (V).

284

bgidldo=41.0

GIDL probability factor at TR at drain side (V).

285

stbgidlo=0.0

Temperature dependence of BGIDL (V/K).

286

stbgidldo=0.0

Temperature dependence of BGIDL at drain side (V/K).

287

cgidlo=0.0

Substrate bias dependence of GIDL (V^-1).

288

cgidldo=0.0

Substrate bias dependence of GIDL at drain side (V^-1).

289

dgidll=0.0

High longitudinal field parameter of GIDL (V^-1).

290

dgidldl=0.0

High longitudinal field parameter of GIDL at drain side (V^-1).

291

cgbovo=0.0

Geometry-independent gate-substrate overlap capacitance part (F).

292

cgbovl=0.0

Gate-substrate overlap capacitance for a length of LEN (F).

293

nsdaco=1.0e22

Source/Drain effective doping level for AC model (cm^-3).

294

fifw=0.0

Inner fringe capacitance prefactor for a width of WEN.

295

fsceaco=0.0

Short channel effect adjustment factor for charge model.

296

lovo=0.0

Overlap length for gate/source-drain hdd overlap capacitance (m).

297

lovdo=0.0

Overlap length for gate/drain hdd overlap capacitance (m).

298

covdlo=0.0

Overlap capacitance modulation coefficient due to Leff variation.

299

covdlbo=0.0

Overlap capacitance modulation with back bias.

300

covdlw=0.0

Width dependence of COVDL.

301

dvfbovo=0.0

Overlap capacitance flat-band voltage adjustment (V).

302

cfro=0.0

Corner related outer fringe capacitance (F).

303

cfrdo=0.0

Corner related outer fringe capacitance at drain side (F).

304

cfrw=0.0

Outer fringe capacitance per side for a width of WEN (F).

305

cfrdw=0.0

Outer fringe capacitance per side for a width of WEN at drain side (F).

306

csdo=1.0

Drain-source capacitance correction factor.

307

csdbpo=0.0

Drain/source to substrate perimeter capacitance (F/m).

308

rtho=1.0e5

Geometry-independent thermal resistance (K/W).

309

rthl=0.0

Length dependence of RTH.

310

rthw=0.0

Width dependence of RTH.

311

rthlw=9.0

Area dependence of RTH.

312

strtho=0.0

Temperature dependence of RTH.

313

ctho=1.0e-12

Geometry-independent thermal capacitance (J/K).

314

lambtho=1.0e-7

Characteristic length of lateral thermal coupling for multifinger devices (m).

315

ftho=0.0

First neighbour thermal coupling factor for multifinger devices.

316

fnto=1.0

Thermal noise coefficient.

317

nfalw=8.0e22

First coefficient of flicker noise (V^-1/m^4).

318

nfblw=3.0e7

Second coefficient of flicker noise (V^-1/m^2).

319

nfclw=0.0

Third coefficient of flicker noise (V^-1).

320

nfeo=0.0

Flicker noise front transverse field effect coefficient.

321

nfebo=0.0

Flicker noise back transverse field effect coefficient.

322

efo=1.0

Frequency coefficient of flicker noise.

323

swstress=1.0

Stress model selection flag (1= Previous STI stress model, 2= New channel stress model).

324

saref=1.0e-6

Reference distance between OD-edge and poly from one side (m).

325

sbref=1.0e-6

Reference distance between OD-edge and poly from other side (m).

326

wlod=0.0

Width parameter (m).

327

kuo=0.0

Mobility degradation/enhancement coefficient (m).

328

kvsat=0.0

Saturation velocity degradation/enhancement coefficient.

329

tkuo=0.0

Temperature dependence of KUO.

330

lkuo=0.0

Length dependence of KUO (m^LLODKUO).

331

wkuo=0.0

Width dependence of KUO (m^WLODKUO).

332

pkuo=0.0

Cross-term dependence of KUO (m^(LLODKUO+WLODKUO)).

333

llodkuo=0.0

Length parameter for UO stress effect.

334

wlodkuo=0.0

Width parameter for UO stress effect.

335

kvtho=0.0

Threshold shift parameter (Vm).

336

lkvtho=0.0

Length dependence of KVTHO (m^LLODVTH).

337

wkvtho=0.0

Width dependence of KVTHO (m^WLODVTH).

338

pkvtho=0.0

Cross-term dependence of KVTHO (m^(LLODVTH+WLODVTH)).

339

llodvth=0.0

Length parameter for VTH-stress effect.

340

wlodvth=0.0

Width parameter for VTH-stress effect.

341

stetao=0.0

Eta0 shift factor related to VTHO change (m).

342

lodetao=1.0

Eta0 shift modification factor for stress effect.

343

strlambda=1.0e-7

Relaxation characteristic length (m).

344

stralpha=3.0

Asymmetry parameter.

345

strdvfbo=0.0

Threshold shift parameter (V).

346

strwdvfbo=0.0

Width dependence of threshold shift parameter.

347

strdcfl=0.0

DIBL variation parameter.

348

strruo=0.0

Mobility degradation/enhancement coefficient.

349

strtruo=0.0

Temperature dependence of mobility degradation/enhancement coefficient.

350

strrvsat=0.0

Saturation velocity degradation/enhancement coefficient.

351

vthmod

Vth output selector. 'std' outputs model equation Vth. vthcc outputs constant current Vth, and may impact simulation performance. The default value is taken from the options parameter vthmod. Possible values are std and vthcc.

352

ivth (A)

Vth current parameter. The default value is taken from the options parameter ivthn or ivthp, depending on the type of the model.

353

ivthw (m)

Width offset for constant current Vth. The default value is taken from the options parameter ivthw.

354

ivthl (m)

Length offset for constant current Vth. The default value is taken from the options parameter ivthl.

355

ivth_vdsmin (V)

Minimum Vds in constant current Vth calculating. The default value is taken from the options parameter ivth_vdsmin.

356

fntexc=0.0

Excess noise coefficient.

357

axl2=0.0

Second order length dependence of AX.

358

axlexp2=1.5

Exponent for second order length dependence of AX.

359

agidlo=0.0

GIDL geometry-independent pre-factor (A/V^3).

360

agidldo=0.0

GIDL geometry-independent pre-factor at drain side (A/V^3).

361

dgidlo=0.0

High field geometry-independent parameter of GIDL (V^-1).

362

dgidldo=0.0

High field geometry-independent parameter of GIDL at drain side (V^-1).

363

fntexcl=0.0

Length dependence coefficient of excess noise.

364

fntexclexp=2.0

Length dependence exponent of excess noise.

365

l=(30 1.0e-9)

Designed Gate Length.

366

nf=1

Number of fins per finger.

367

lmin=0.0 m

Minimum channel length for which the model is valid.

368

lmax=1.0 m

Maximum channel length for which the model is valid.

369

wmin=0.0 m

Minimum channel width for which the model is valid.

370

wmax=1.0 m

Maximum channel width for which the model is valid.

Output Parameters

1

meff

Effective multiplicity factor (m-factor).

Operating-Point Parameters

1

typeop

MOSFET type.

2

vth (V)

Threshold voltage including back bias and drain bias effects.

3

vds (V)

Drain-Source DC voltage.

4

vsb (V)

Source-Bulk DC voltage.

5

vdb (V)

Drain-Bulk DC voltage.

6

vgs (V)

Gate-Source DC voltage.

7

vgd (V)

Gate-Drain DC voltage.

8

vth_drive (V)

Effective gate drive voltage including back bias and drain bias effects.

9

vdsat (V)

Drain saturation voltage.

10

vdsat_marg (V)

Saturation limit.

11

ids (I)

DC Channel current (excluding tunnel, GISL and GIDL currents).

12

id (I)

Total DC drain current.

13

ig (I)

Total DC gate current.

14

is (I)

Total DC source current.

15

ib (I)

Total DC bulk current.

16

igidl (I)

DC GIDL current.

17

igisl (I)

DC GISL current.

18

igs (I)

DC gate-source leakage current.

19

igd (I)

DC gate-drain leakage current.

20

idb (I)

DC drain-bulk current.

21

isb (I)

DC source-bulk current.

22

gm

DC transconductance.

23

gmb

DC bulk transconductance.

24

go

DC output conductance.

25

gds

DC output conductance.

26

cdd (C)

Drain capacitance.

27

cdg (C)

Drain to gate transcapacitance.

28

cdb (C)

Drain to bulk transcapacitance.

29

cds (C)

Drain to source transcapacitance.

30

cgd (C)

Gate to drain transcapacitance.

31

cgg (C)

Gate capacitance.

32

cgb (C)

Gate to bulk transcapacitance.

33

cgs (C)

Gate to source transcapacitance.

34

cbd (C)

Bulk to drain transcapacitance.

35

cbg (C)

Bulk to gate transcapacitance.

36

cbb (C)

Bulk capacitance.

37

cbs (C)

Bulk to source transcapacitance.

38

csd (C)

Source to drain transcapacitance.

39

csg (C)

Source to gate transcapacitance.

40

csb (C)

Source to bulk transcapacitance.

41

css (C)

Source capacitance.

42

co (C)

Output Drain-Source capacitance.

43

cm (C)

Capacitance element 1 for QS model.

44

cmb (C)

Capacitance element 2 for QS model.

45

cmx (C)

Capacitance element 3 for QS model.

46

tau1 (s)

Time constant related to NQS first frequency pole.

47

fqslim (Hz)

QS model frequency limit.

48

tk

MOSFET device temperature.

49

dtsh

Channel temperature elevation due to self-heating.

50

self_gain

Self gain.

51

rout (R)

Output resistance.

52

vearly (V)

Equivalent early voltage.

53

beff

Gain factor.

54

ft

Unity gain frequency.

55

rgate (R)

Gate resistance.

56

gmoveri

Gm over Id.

57

gmoverid

Gm over Id.

58

pwr (W)

Power dissipation.

59

region

Estimated operating region. Spectre outputs a number (0-4) in a raw file. Possible values are off, triode, sat, subth, and breakdown.

60

opdef

1: Device Physics notation. 2: Circuit Simulator notation.

61

ctype

Flag for channel type of MOSFET. 1: NMOS. -1: PMOS.

62

sdop

Operation mode related to channel type and drain-source voltage sign.
Possible values are Forward and Reverse.

63

sdint

Flag for source drain interchange. 1: No S-D interchange, -1: S-D interchange.

64

cjd (C)

Total drain-bulk junction capacitance, including bottom and sidewall regions.

65

cjs (C)

Total source-bulk junction capacitance, including bottom and sidewall regions.

66

vth0 (V)

Zero-bias threshold voltage, excluding back-bias (body effect) and drain-bias effect (DIBL).

Parameter Index

In the following index, I refers to instance parameters, M refers to the model parameters section, O refers to the output parameters section, and OP refers to the operating point parameters section. The number indicates where to look in the appropriate section to find the description for that parameter. For example, a reference of M-35 means the 35th model parameter.

adrain I-4 csthr M-50 m I-12 stthecs M-49
agidl M-95 csthrb M-51 meff O-1 stthecso M-213
agidld M-96 csthrbo M-215 mue M-52 stthemu M-55
agidldw M-282 csthro M-214 mueo M-216 stthemuo M-219
agidlw M-281 csw M-204 mult I-11 stthesat M-67
alp M-71 ct M-20 nch M-18 stthesatl M-241
alp1 M-72 cth M-121 ncho M-143 stthesatlw M-243
alp1l1 M-254 ctho M-313 nf I-10 stthesato M-240
alp1l2 M-256 cto M-145 nfa M-123 stthesatw M-242
alp1lexp M-255 delvto I-13 nfalw M-317 stvfb M-26
alp1lexp2 M-257 dgidl M-103 nfb M-124 stvfbl M-159
alp1w M-258 dgidld M-104 nfblw M-318 stvfblw M-161
alpb M-73 dgidldl M-290 nfc M-125 stvfbo M-158
alpbo M-259 dgidll M-289 nfclw M-319 stvfbw M-160
alpl1 M-249 dlq M-137 nfe M-126 stxcor M-58
alpl2 M-251 dtsh OP-40 nfeb M-127 stxcoro M-226
alplexp M-250 dvfbov M-114 nfebo M-321 swclipchk M-3
alplexp2 M-252 dvfbovo M-301 nfeo M-320 swgidl M-6
alpw M-253 dwq M-138 niginv M-94 swigate M-5
areaq M-105 ef M-128 niginvo M-280 swign M-8
asource I-3 efo M-322 nov M-22 swjunasym M-9
ax M-70 factuo I-14 novd M-23 swscale M-1
axl M-247 fbet1 M-184 novdo M-148 swshe M-7
axlexp M-248 fbet1w M-185 novo M-147 swstress M-323
axo M-246 fbet2 M-188 nsdac M-107 swsubdep M-4
beff OP-44 feta M-59 nsdaco M-293 tbox M-17
betn M-41 fetao M-227 nsddc M-32 tboxo M-142
betnb M-42 fif M-108 nsddco M-170 thecs M-48
betnbo M-196 fifw M-294 nsub M-19 thecso M-212
betnl M-193 fnt M-122 nsubo M-144 themu M-54
betnlexp M-194 fnto M-316 pdrain I-6 themuo M-218
betnw M-195 fsceac M-109 pkuo M-332 thersg M-64
betw1 M-190 fsceaco M-295 pkvtho M-338 thersgo M-233
betw2 M-191 ft OP-45 pnce M-34 thesat M-66
bgidl M-97 ftho M-315 pncew M-172 thesatb M-69
bgidld M-98 gc2ch M-83 psce M-29 thesatbo M-245
bgidldo M-284 gc2cho M-269 psceb M-30 thesatg M-68
bgidlo M-283 gc2ov M-85 pscebo M-167 thesatgo M-244
cbb OP-33 gc2ovacc M-89 pscedl M-31 thesatl M-236
cbd OP-31 gc2ovacco M-275 pscedlb M-33 thesatlexp M-237
cbg OP-32 gc2ovinv M-87 pscedlbo M-171 thesatlw M-239
cbs OP-34 gc2ovinvo M-273 pscedll M-168 thesato M-235
cdb OP-25 gc2ovo M-271 pscedlw M-169 thesatw M-238
cdd OP-23 gc3ch M-84 pscel M-164 tk OP-39
cdg OP-24 gc3cho M-270 pscelexp M-165 tkuo M-329
cds OP-26 gc3ov M-86 pscew M-166 tmax M-13
cf M-35 gc3ovacc M-90 psource I-5 toxe M-14
cfb M-36 gc3ovacco M-276 pwr OP-48 toxeo M-139
cfbo M-176 gc3ovinv M-88 qmc M-10 toxp M-21
cfd M-38 gc3ovinvo M-274 region OP-49 toxpo M-146
cfdl M-39 gc3ovo M-272 rgate OP-46 tr M-12
cfdlb M-40 gcdov M-91 rout OP-42 trise I-15
cfdlbo M-182 gcdovl M-277 rs M-60 tsi M-15
cfdll M-180 gco M-76 rsb M-65 tsio M-140
cfdlw M-181 gcoo M-262 rsbo M-234 type M-11
cfdo M-179 gcvdov M-92 rsg M-63 typeop OP-1
cfl M-173 gcvdovo M-278 rsgo M-232 uo M-183
cflexp M-174 gds OP-22 rsig M-61 vds OP-3
cfr M-115 gm OP-20 rsigo M-230 vdsat OP-7
cfrd M-116 gmb OP-21 rsw1 M-228 vdsat_marg OP-8
cfrdo M-303 gmoverid OP-47 rsw2 M-229 vearly OP-43
cfrdw M-305 ib OP-13 rth M-119 version M-2
cfro M-302 id OP-10 rthl M-309 vfb M-24
cfrw M-304 idb OP-18 rthlw M-311 vfbb M-25
cfw M-175 ids OP-9 rtho M-308 vfbbo M-156
cgb OP-29 ig OP-11 rthw M-310 vfbl M-150
cgbov M-106 igd OP-17 sa I-7 vfbl2 M-152
cgbovl M-292 igidl OP-14 saref M-324 vfblbo M-157
cgbovo M-291 iginv M-77 sb I-8 vfblexp M-151
cgd OP-27 iginvlw M-263 sbref M-325 vfblexp2 M-153
cgg OP-28 igisl OP-15 sd I-9 vfblw M-155
cgidl M-101 igovacc M-80 self_gain OP-41 vfbo M-149
cgidld M-102 igovaccd M-81 stbet M-43 vfbw M-154
cgidldo M-288 igovaccdw M-267 stbetl M-198 vgs OP-5
cgidlo M-287 igovaccw M-266 stbetlw M-200 vp M-74
cgs OP-30 igovinv M-78 stbeto M-197 vpg M-75
chib M-93 igovinvd M-79 stbetw M-199 vpgo M-261
chibo M-279 igovinvdw M-265 stbgidl M-99 vpo M-260
cic M-28 igovinvw M-264 stbgidld M-100 vsb OP-4
cicf M-27 igs OP-16 stbgidldo M-286 vth OP-2
cicfo M-162 is OP-12 stbgidlo M-285 vth_drive OP-6
cico M-163 isb OP-19 stcf M-37 vthmod M-351
cov M-110 isnoisy I-16 stcfl M-178 w I-2
covd M-111 ivth M-352 stcfo M-177 wbet M-192
covdl M-112 ivth_vdsmin M-355 stcs M-47 wkuo M-331
covdlb M-113 ivthl M-354 stcsl M-209 wkvtho M-337
covdlbo M-299 ivthw M-353 stcslw M-211 wlod M-326
covdlo M-298 kuo M-327 stcso M-208 wlodkuo M-334
covdlw M-300 kvsat M-328 stcsw M-210 wlodvth M-340
cs M-44 kvtho M-335 stetao M-341 wot M-136
csb OP-37 l I-1 stig M-82 wvarl M-134
csbi M-46 lambtho M-314 stigo M-268 wvaro M-133
csbio M-207 lap M-132 stmue M-53 wvarw M-135
csd M-117 lkuo M-330 stmueo M-217 xcor M-56
csd OP-35 lkvtho M-336 stralpha M-344 xcorb M-57
csdbp M-118 llodkuo M-333 strdcfl M-347 xcorbo M-225
csdbpo M-307 llodvth M-339 strdvfbo M-345 xcorl M-221
csdo M-306 lodetao M-342 strlambda M-343 xcorlexp M-222
csfi M-45 lovdo M-297 strruo M-348 xcorlw M-224
csfio M-206 lovo M-296 strrvsat M-350 xcoro M-220
csg OP-36 lp1 M-186 strs M-62 xcorw M-223
csl M-202 lp1w M-187 strso M-231 xge M-16
cslexp M-203 lp2 M-189 strth M-120 xgeo M-141
cslw M-205 lvarl M-130 strtho M-312
cso M-201 lvaro M-129 strtruo M-349
css OP-38 lvarw M-131 strwdvfbo M-346

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