Viewing EM-IR Analysis Reports

By default, Voltus-XFi generates the following reports for EM-IR analysis:

• Summary report (summary.rpt), which includes reports for all analyses (IR drop and EM) performed in the current run
• IR drop analysis report with the extension, *.rpt_ir
• EM analysis report with the extension, *.rpt_em
• Unmatched resistors report with the extension, *.rpt_unmatch
• Pin current report with the extension, *.rpt_pin

To view the EM-IR analysis reports, do the following:

1. On the Voltus-XFi window, choose Results from the task pane.
2. Select an analysis, test, and corner for which you want to view the reports.
3. Select the Reports tab.
   
   
4. In the Text Reports section, click on a report that you want to view under the Type column.
   The selected report is displayed in a separate window.

Related Topics

• Summary Report
• IR Report
• EM Report
• Unmatched Resistor Report
• Pin Current Report
• Viewing Waveform Results

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