Product Documentation
Voltus-XFi Custom Power Integrity Solution User Guide
Product Version IC23.1, November 2023


Contents

1

Voltus-XFi Licensing Information

Voltus-XFi Release Compatibility Matrix

2

Introduction to Voltus-XFi

Voltus-XFi Flow Overview

Data Requirements for Voltus-XFi

Launching Voltus-XFi in the GUI Mode

Starting the Virtuoso Studio Design Environment
Starting Voltus-XFi EM-IR

Getting Familiar with the Interface

Task Pane
Menus
Toolbar
Main Window

Voltus-XFi Log Viewer

3

Setting Up and Running EM-IR Analysis

Specifying EM-IR Project Settings

Specifying Custom Foundry and Node Information

Specifying EM Rule Settings

Specifying Power Nets for EM-IR Analysis

Specifying Parasitic Extraction Settings

Setting Up an Extraction Job Policy

Editing a Job Policy
Deleting a Job Policy

Using an Existing DSPF File

Using an Existing CCL File

Specifying New Extraction Settings

Specifying Advanced Extraction Settings

Specifying Simulation Settings

Performing Dynamic Analysis

Performing IR Analysis for LDOs, Voltage Regulators, and Generators

Performing Static Power Grid Solver Analysis

Performing Static Analysis

Running Post Layout Simulation

Generating a DSPF

Running EM-IR Analysis

Running DSPF Linter on a DSPF Netlist File

4

Viewing EM-IR Analysis Results

Working with History Items

Rerunning EM Analysis with Different EM Settings

The Voltus-XFi Results Browser Graphical User Interface

Customizing Data Loading of EM-IR Analysis Results

Displaying and Hiding Voltus-XFi Results Browser

Visualizing EM-IR Analysis Results using Voltus-XFi Results Browser

Querying Specific Areas and Shapes in the Layout for Node/Resistor Information

Performing LRP Analysis

Shorting Layers for LRP Analysis

Selecting a Node for LRP Analysis from the IR Tab

Viewing Detailed Electromigration Information

Viewing the Thermal Delta-T Plots

Customizing the Range for Viewing Violations

Loading and Viewing Nets from a Power Gate Group

Viewing EM-IR Analysis Reports

Summary Report

IR Report

EM Report

Unmatched Resistor Report

Pin Current Report

Viewing Waveform Results

5

Environment Variables

ambientTemp
blockingDeviceFile
compressDSPF
cornerName
customFoundrySetupDir
dataSource
deltaTemp
designResistorFile
designResistorUnit
dfIILayerMapFile
dspfNetListExtraPort
dynamicAnalysisOptionsFile
emRuleFile
enableBalloon
enableFIT
enableSmallerPrecision
enableViolationColoring
enableHeatSink
enableSHE
extractionDir
extractionMode
foundry
fractureViaCount
145
includetCmdFile
lifeTime
loadResultsSettingsFile
lvsSource
modeFit
modeSHE
node
paramFileFit
paramFileSHE
pinOrderFile
productLife
projectDir
qrcTechFile
RCType
rciRCXFile
signalNetsIRFile
simulationDir
techDir
techLibraryFile
techName
temp
tileXSHE
tileYSHE
useSeparateDirs
useTempCoeff
viaArrayCount
viaArraySpacing
uriModelFile

6

Voltus-XFi EM-IR Form Description

Voltus-XFi EM-IR GUI – Setup Tab

Voltus-XFi EM-IR GUI – Run Tab

Voltus-XFi EM-IR GUI – Results Tab

Voltus-XFi EM-IR GUI – Diagnostic Tools Tab

7

SKILL Functions

vxfiLoadNets
vxfiLoadEMIRResults
vxfiOpenLayout
vxfiSaveNetSummaryInfoToCSV
vxfiSessionConnect
vxfiSessionRegisterCreationCallback
vxfiSetLVSQueryOutputDirectory
vxfiSetLVSRunName

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