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Introduction to Voltus-XFi
Voltus-XFi Custom Power Integrity Solution is used for transistor-level power and signal integrity analysis, which includes multi-mode simulation (MMSIM) for electromigration (EM) and voltage drop (IR) analysis. The target designs include large analog, mixed-signal, and custom digital blocks created in Virtuoso Studio Design Environment. Voltus-XFi provides designers with a single, unified cockpit for parasitic extraction (using Quantus), simulation (using ADE and Spectre X), and EM-IR analysis.
The salient features of Voltus-XFi are:
- An intuitive workflow-based GUI to setup and run extraction, simulation, and analysis.
- A tabbed interface that allows users to seamlessly switch between different applications.
- Ability to create th Virtuoso tungsten cell view to store the EM-IR extraction and simulation setup.
- Reuse of existing ADE maestro views to drive simulation. Voltus-XFi does not write to ADE maestro views.
- Integrated with the Spectre X simulator to analyze large post-layout netlists with high fidelity.
- An intuitive preset-based, iterative use model to allow performance versus accuracy trade-offs.
- A persistent database to store EM-IR results, optimized for loading and viewing results in Virtuoso Layout.
- An integrated Results Browser assistant to analyze and debug results directly on the Virtuoso layout.
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