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BSIM4 Level-14 Model (bsim4)
BSIM4 model, as the extension of BSIM3v3 model, addresses more physical effects for MOSFET device of 100 nm and beyond. Gate leakage, layout dependent effects, high-K, and so on, are modeled in BSIM4.
Click the following links for information about the BSIM4 model:
- Instance
- Model
- Equivalent Circuit
- Device Regions
- Global Control Options
- JUNCAP Model
- TMI 1.0 Model
- TMI 2.0 Model
- Model Version Update
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Model Equations
- Effective Oxide Thickness, Channel Length and Channel Width
- Threshold Voltage Model
- Channel Charge and Subthreshold Swing Models
- Gate Direct Tunneling Current Model
- Drain Current Model
- Body Current Model
- Capacitance Model
- Overlap Capacitance Models
- High Speed/RF Models
- Noise Models
- Asymmetric MOS Junction Diode Models
- Layout Dependent Parasitics Models
- Temperature Effects Models
- Stress Effects Models
- Well Proximity Effect Model
- TMIBSIM4 Model (tmibsim4)
- Models and Equations in Version Updates
- Component Statements
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